Year	2019
Authors	Hao-Chiao Hong
Paper Title	H.-C. Hong and L.-Y. Lin, "Accurate and Fast On-Wafer Test Circuitry for Device Array Characterization in Wafer Acceptance Test," presented in IEEE International Symposium on Integrated Circuits and Systems (ISICAS), Venice, Italy, Aug., 2019
Date of Publication	2019-08-15
Language	Chinese