Year 2012
Book Title

Book Chapters

1.        C.L. Wey, C.-c. Wu, and R. Saeks, "Analog Fault Diagnosis," Testing and Diagnosis of VLSI and ULSI, Ed. by M. Sami and F. Lombardi, Kluwer Academic Publisher, pp.117-150, 1988.

2.        F. Lombardi and C.L. Wey, "On Front Reconfiguration of VLSI Arrays," Testing and Diagnosis of VLSI and ULSI, Ed. by M. Sami and F. Lombardi, Kluwer Academic Publisher, pp.429-468, 1988.

3.        C.L. Wey and R. Saeks, "On the Implementation of Analog ATPG: The Linear Case," Analog Fault Diagno­sis, Edited by R.W. Liu, IEEE PRESS, 1989.

4.        C.L. Wey, "A Searching Approach Self-Testing Algorithm for Analog Fault Diagnosis," Testing and Diagno­sis of Analog Circuits and Systems, Ed. by R.W. Liu, Van Nostrand Reinhold, New York, pp.147-185, 1991.

5.        C.L. Wey, "Test techniques for CMOS Switched-Current Circuits," Analog and Mixed-Signal Test, Edited by B. Vinnakota, Prentice-Hall, Inc., 1998.

Authors Chin-Long Wey
Publish Date 2012-11-14