年度	2017
全部作者	洪浩喬
論文名稱	H.-C. Hong, L.-Y. Lin, and C.-J. Liu, " Design of an On-Scribe-Line 12-bit Dual-Slope ADC for Wafer Acceptance Test," Proc. IEEE International Conference on Applied System Innovation (CASI), Sapporo, Japan, May, 2017 (EI, IEEE)
發表日期	2017-04-27
語言	中文