年度	2019
全部作者	洪浩喬
論文名稱	Hao-Chiao Hong and Long-Yi Lin, "Accurate and Fast On-Wafer Test Circuitry for Device Array Characterization in Wafer Acceptance Test," IEEE Transactions on Circuits and Systems I: Regular Papers, Vol. 66, No 9, pp. 3467-3479, Sep., 2019 (SCI)
發表日期	2019-09-01
語言	中文